Category: Testing and Non-Destructive Inspection Equipment
Exhibitor:
SCREEN GP (THAILAND) CO., LTD.
Booth No: B532
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Description
Hybrid Pattern AOI (2D + 3D)
2D Pattern Inspection Resolution : 8 μm (Down To 2 μm) Min. Line / Space Width : 40 μm (@8 μm) 16K Color Line Scan Camera / 4CH Color LED Illumination AI Friendly Color Defect Image Various Detection Algorithm (DRC, MDRC, MRC, SMI)
3D Metrology White Light Interferometry Z-Resolution : 50 nm
Measurement Repeatability TOP : ±1.0 μm BTM : ±1.5 μm
Measurement Pattern Width / Pattern Thickness Dimple Depth / Pad Diameter Etc.
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