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OHM+ Fast GT-S RF FEM ATE Series

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Category: Semiconductor Manufacturing

Exhibitor: OHMPLUS TECHNOLOGY INC.

Booth No: H138

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Description
GT-S is a multi-site ATE group-test system designed for RF FEM chips. Combined with self-developed MEB, a phase distributors, and high-power RF modules, it supports over 4-site RF front-end IC testing. Built-in testing functions include S-parameters, power, EVM, spectrum mask, and so on.

Related Products
OHM+ Fast OTA Phased Array Testing Series
OHM+ DPA Phased-Array Antenna Development Kit

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