Optical Inspection System (AOI) - MIYABI X/S/B/C

LVH inspection System
An advanced evolution line-up to meet the demand for LVH inspection of semiconductor package substrates!
Entire LVH inner inspection with extremely high speed!

MIYABI offers robust support for the quantitative management of lasers via quality and process improvement.
Also, is combined with tried-and-true inspection performance and diverse analysis functions for early detection of defects such as LVH misalignment or penetration failure, foreign material, contamination and smear remaining.

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